/***********************************************************************
* *
* This software is part of the ast package *
* Copyright (c) 1982-2011 AT&T Intellectual Property *
* and is licensed under the *
* Eclipse Public License, Version 1.0 *
* by AT&T Intellectual Property *
* *
* A copy of the License is available at *
* http://www.eclipse.org/org/documents/epl-v10.html *
* (with md5 checksum b35adb5213ca9657e911e9befb180842) *
* *
* Information and Software Systems Research *
* AT&T Research *
* Florham Park NJ *
* *
* David Korn <dgk@research.att.com> *
* *
***********************************************************************/
#pragma prototyped
#ifndef TEST_ARITH
/*
* UNIX shell
* David Korn
* AT&T Labs
*
*/
#include "FEATURE/options"
#include "defs.h"
#include "shtable.h"
/*
* These are the valid test operators
*/
#define TEST_ARITH 040 /* arithmetic operators */
#define TEST_BINOP 0200 /* binary operator */
#define TEST_PATTERN 0100 /* turn off bit for pattern compares */
#define TEST_NE (TEST_ARITH|9)
#define TEST_EQ (TEST_ARITH|4)
#define TEST_GE (TEST_ARITH|5)
#define TEST_GT (TEST_ARITH|6)
#define TEST_LE (TEST_ARITH|7)
#define TEST_LT (TEST_ARITH|8)
#define TEST_OR (TEST_BINOP|1)
#define TEST_AND (TEST_BINOP|2)
#define TEST_SNE (TEST_PATTERN|1)
#define TEST_SEQ (TEST_PATTERN|14)
#define TEST_PNE 1
#define TEST_PEQ 14
#define TEST_EF 3
#define TEST_NT 10
#define TEST_OT 12
#define TEST_SLT 16
#define TEST_SGT 17
#define TEST_END 8
#define TEST_REP 20
extern int test_unop(Shell_t*,int, const char*);
extern int test_inode(const char*, const char*);
extern int test_binop(Shell_t*,int, const char*, const char*);
extern const char sh_opttest[];
extern const char test_opchars[];
extern const char e_argument[];
extern const char e_missing[];
extern const char e_badop[];
extern const char e_tstbegin[];
extern const char e_tstend[];
#endif /* TEST_ARITH */